Harsh Environment Sensors for Geothermal Applications
Technical papers detailing the development of harsh environment sensors for geothermal applications. Principle Investigator is Prof. Albert P. Pisano (University of California, Berkeley). Submission includes a paper about geothermal environmental exposure testing on encapsulant and device materials in addition to a paper pertaining to MEMS Sensors for downhole monitoring of geothermal systems.
Complete Metadata
| @type | dcat:Dataset |
|---|---|
| accessLevel | public |
| bureauCode |
[
"019:20"
]
|
| contactPoint |
{
"fn": "Debbie G. Senesky",
"@type": "vcard:Contact",
"hasEmail": "mailto:dsenesky@eecs.berkeley.edu"
}
|
| dataQuality |
true
|
| description | Technical papers detailing the development of harsh environment sensors for geothermal applications. Principle Investigator is Prof. Albert P. Pisano (University of California, Berkeley). Submission includes a paper about geothermal environmental exposure testing on encapsulant and device materials in addition to a paper pertaining to MEMS Sensors for downhole monitoring of geothermal systems. |
| distribution |
[
{
"@type": "dcat:Distribution",
"title": "Geothermal Environmental Exposure Testing of Encapsulant and Device Materials for Harsh Environment MEMS Sensor.pdf",
"format": "pdf",
"accessURL": "https://gdr.openei.org/files/90/UCBerkeley_Pisano_Geothermal_Paper_1.pdf",
"mediaType": "application/pdf",
"description": "Report detailing mass change and sputter XPS chemical analysis conducted on silicon, sapphire, silicon carbide (SiC), and aluminum nitride (AlN) after up to 100 hours of exposure testing in water at its critical point. "
},
{
"@type": "dcat:Distribution",
"title": "MEMS Sensors for Down-Hole Monitoring of Geothermal Energy Systems.pdf",
"format": "pdf",
"accessURL": "https://gdr.openei.org/files/90/UCBerkeley_Pisano_Geothermal_Paper_2.pdf",
"mediaType": "application/pdf",
"description": "This paper reviews the limitations in current down-hole monitoring technologies for geothermal energy systems and introduces microelectromechanical systems (MEMS) sensors as a means of optimizing well performance. "
}
]
|
| identifier | https://data.openei.org/submissions/6479 |
| issued | 2012-01-01T07:00:00Z |
| keyword |
[
"aluminum nitride",
"chemical analysis",
"down-hole",
"downhole",
"encapsulation",
"environmental exposure",
"exposure",
"geothermal",
"harsh environment",
"logging",
"mass change",
"mems",
"microelectromechanical",
"monitoring",
"pressure",
"sapphire",
"sensor",
"silicon carbide",
"sputter xps",
"temperature"
]
|
| landingPage | https://gdr.openei.org/submissions/90 |
| license | https://creativecommons.org/licenses/by/4.0/ |
| modified | 2019-06-19T15:05:44Z |
| programCode |
[
"019:006"
]
|
| projectLead | Greg Stillman |
| projectNumber | EE0002753 |
| projectTitle | Recovery Act: Harsh Environment Silicon Carbide Sensor Technology for Geothermal Instrumentation |
| publisher |
{
"name": "Regents of the University University of California",
"@type": "org:Organization"
}
|
| spatial |
"{"type":"Polygon","coordinates":[[[-123.6496140625,37.143025589465],[-120.716365625,37.143025589465],[-120.716365625,38.920319089869],[-123.6496140625,38.920319089869],[-123.6496140625,37.143025589465]]]}"
|
| title | Harsh Environment Sensors for Geothermal Applications |
