Found 9 datasets matching filters.
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The NIST Electron Inelastic-Mean-Free-Path Database provides values of electron inelastic mean free paths (IMFPs) principally for use in surface analysis by Auger-electron spectroscopy and X-ray...
Search relevance: 1.00 | Views last month: 4 | Published on: 2025-08-02 -
NIST X-ray Photoelectron Spectroscopy Database XPS contains over 33,000 data records that can be used for the identification of unknown lines, retrieval of data for selected elements (binding...
Search relevance: 1.00 | Views last month: 3 | Published on: 2025-08-02 -
Note that this SRD supersedes SRD 64 Version 3.2. The NIST Electron Elastic-Scattering Cross-Section Database provides values of differential elastic-scattering cross sections, total...
Search relevance: 1.00 | Views last month: 2 | Published on: 2025-08-02 -
The dataset contains the data that underlies the figures and tables in the published article. It also contains the data that underlies the figures in supplemental material. This dataset is...
Search relevance: 1.00 | Views last month: 2 | Published on: 2025-08-02 -
**** Note that this SRD is superseded by SRD 64 Version 4.0. ****The NIST Electron Elastic-Scattering Cross-Section Database provides values of differential elastic-scattering cross sections,...
Search relevance: 1.00 | Views last month: 0 | Published on: 2025-08-02 -
The NIST Database of Cross Sections for Inner-Shell Ionization by Electron or Positron Impact provides cross sections for ionization of the K shell and of the L and M subshells of neutral atoms of...
Search relevance: 1.00 | Views last month: 0 | Published on: 2025-08-02 -
The NIST Database for the Simulation of Electron Spectra for Surface Analysis (SESSA) can be used to simulate Auger-electron spectra and X-ray photoelectron spectra of nanostructures such as...
Search relevance: 1.00 | Views last month: 0 | Published on: 2025-08-02 -
The NIST Electron Effective Attenuation Length Database provides values of electron effective attenuation lengths (EALs) in materials at user-selected electron energies between 50 eV and 2,000 eV....
Search relevance: 1.00 | Views last month: 0 | Published on: 2025-08-02 -
This database provides values of backscattering correction factors (BCF) of homogeneous materials for quantitative surface analyses by Auger electron spectroscopy. These BCFs are obtained from...
Search relevance: 1.00 | Views last month: 0 | Published on: 2025-08-02
