• Organization: National Institute of Standards and Technology
• Updated: 2015-07-01 00:00:00

This database provides values of backscattering correction factors (BCF) of homogeneous materials for quantitative surface analyses by Auger electron spectroscopy. These BCFs are obtained from...

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• Organization: National Institute of Standards and Technology
• Updated: 2014-11-01 00:00:00

The NIST Database for the Simulation of Electron Spectra for Surface Analysis (SESSA) can be used to simulate Auger-electron spectra and X-ray photoelectron spectra of nanostructures such as...

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