• Organization: National Institute of Standards and Technology
• Updated: 2011-01-01 00:00:00

The NIST Electron Effective Attenuation Length Database provides values of electron effective attenuation lengths (EALs) in materials at user-selected electron energies between 50 eV and 2,000 eV....

• html
• html

• Organization: National Institute of Standards and Technology
• Updated: 2010-12-01 00:00:00

The NIST Electron Inelastic-Mean-Free-Path Database provides values of electron inelastic mean free paths (IMFPs) principally for use in surface analysis by Auger-electron spectroscopy and X-ray...

• html
• html

• Organization: National Institute of Standards and Technology
• Updated: 2012-10-10 00:00:00

NIST X-ray Photoelectron Spectroscopy Database XPS contains over 33,000 data records that can be used for the identification of unknown lines, retrieval of data for selected elements (binding...

• html