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Found 2 datasets matching "Micro Electro Mechanical Systems".

Federal
NIST MEMS Calculator - SRD 166
- Organization: National Institute of Standards and Technology
- Updated: 2014-05-22 00:00:00
This MEMS Calculator determines the following thin film properties from data taken with an optical interferometer or comparable instrument: a) residual strain from fixed-fixed beams, b) strain...
- html
Search relevance: 61.48 | Views last month: 0
Federal
Thin Silicon Detector Technology for Use in Imaging Solar ENAs Project
- Organization: National Aeronautics and Space Administration
- Updated: 2025-03-31
 Top Level Objective: To enable capabilities for imaging and spectral measurements of energetic neutral hydrogen atoms (ENAs) produced with energies &sim;1MeV/nuc in...
- xml
Search relevance: 43.28 | Views last month: 0

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NIST MEMS Calculator - SRD 166

Thin Silicon Detector Technology for Use in Imaging Solar ENAs Project