• Organization: National Institute of Standards and Technology
• Updated: 2022-09-12 00:00:00

In this paper, we have demonstrated the importance of choosing the correct reference plane for applications such as over-the-air (OTA) modulated-signal measurements at millimeter-wave frequencies....

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• Organization: National Institute of Standards and Technology
• Updated: 2023-06-08 00:00:00

Data published in paper "Microstrip and Grounded CPW Calibration Kit Comparison for On-Wafer Transistor Characterization from 220 GHz to 325 GHz"We investigated the effect of two uncertainty...

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• Organization: National Institute of Standards and Technology
• Updated: 2024-01-23 00:00:00

data published in paper "On-Wafer Device Characterization Including Uncertainty Estimates to 1.0 THz"This dataset contains the calibrated scattering parameters (S-parameters) of a thru that was...

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• Organization: National Institute of Standards and Technology
• Updated: 2024-08-13 00:00:00

This dataset contains the simulated data of a ground-signal-ground on-wafer probe landed on a microstrip variable-impedance device (DUT) with a 775 micron (um) microstrip line neighboring the...

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