Found 21 datasets matching "XPS".
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SORCE XPS Level 4 Solar Spectral Irradiance 0.1nm Res 24-Hour Means V012 (SOR4XPSD_HIGH) at GES DISC
The SORCE XPS Level 4 Solar Spectral Irradiance 0.1nm Res 24-Hour Means product (SOR4XPSD_HIGH) contains modelled spectral extreme ultraviolet (XUV) irradiances based on calibrated SORCE XUV...
Search relevance: 102.54 | Views last month: 0 -
The SORCE Combined XPS, SOLSTICE, and SIM Solar Spectral Irradiance 24-Hour Means product consists of daily averages of the solar spetra from 0.1 to 2412 nm. The SORCE instruments make...
Search relevance: 101.44 | Views last month: 0 -
The SORCE XPS Level 4 Solar Spectral Irradiance 0.1nm Res 5-Minute product (SOR4XPS5) contains modelled spectral extreme ultraviolet (XUV) irradiances based on calibrated SORCE XUV Photometer...
Search relevance: 99.68 | Views last month: 0 -
The SORCE XPS Level 4 Solar Spectral Irradiance 1.0nm Res 24-Hour Means product (SOR4XPSD_LOW) contains modelled spectral extreme ultraviolet (XUV) irradiances based on calibrated SORCE XUV...
Search relevance: 98.25 | Views last month: 0 -
The SORCE XUV Photometer System (XPS) Solar Spectral Irradiance (SSI) Daily Data Product SOR3XPSD contains solar extreme ultraviolet irradiances in the 0.1 to 27 nm range, as well as Lyman-alpha,...
Search relevance: 87.77 | Views last month: 0 -
The SORCE XUV Photometer System (XPS) Solar Spectral Irradiance (SSI) 6-Hour Data Product SOR3XPS6 contains solar extreme ultraviolet irradiances in the 0.1 to 27 nm range, as well as Lyman-alpha,...
Search relevance: 86.17 | Views last month: 2 -
The data set shows 1) adsorption kinetics and capacities for Cd(II), Ni(II), Zn(II), Co(II), Pb(II), and Cu(II) as affected by pH and ionic strength; 2) hydrodynamic diameter of nanomaterials as a...
Search relevance: 69.24 | Views last month: 7 -
Additional information about the carboxylated SWCNT calibration curve, AFM images, EDS results, solar simulator light and UVB lamp spectra, TEM image of parent carboxylated SWCNTs, XPS spectra of...
Search relevance: 66.37 | Views last month: 1 -
NIST X-ray Photoelectron Spectroscopy Database XPS contains over 33,000 data records that can be used for the identification of unknown lines, retrieval of data for selected elements (binding...
Search relevance: 56.23 | Views last month: 3 -
SEE Level 3A data files contain each measurements averaged solar irradiance spectrum in 1 nm intervals extracted from the EGS Level 2A and XPS Level 2A data products. Shortward of 27 nm, a solar...
Search relevance: 49.31 | Views last month: 0 -
The Laboratory for Atmospheric and Space Physics in Boulder, Colorado created Level 4 data files for the NASA Solar Dynamics Observatory (SDO) Extreme Ultraviolet Variability Experiment (EVE). The...
Search relevance: 43.22 | Views last month: 1 -
Characterization of nanohybrids using TEM, XPS, zeta potential measurement, UV-Vis spectrometry. Modeling results of nanohybrids transport. This dataset is associated with the following...
Search relevance: 39.76 | Views last month: 0 -
Heavy metal sorption data. Material characterization using scanning electron microscopy (SEM, Hitachi SU8020, Japan) and energy spectrometry (EDS), Fourier transform infrared (FTIR, Nichlet IS...
Search relevance: 38.07 | Views last month: 2 -
The data set contains the elemental composition, pH, and sulfate content of the utilized mining impacted water used as influent in the columns study, the data for pH, Eh, Cd, Fe, Mn, Zn, sulfate...
Search relevance: 32.45 | Views last month: 7 -
The NIST Electron Effective Attenuation Length Database provides values of electron effective attenuation lengths (EALs) in materials at user-selected electron energies between 50 eV and 2,000 eV....
Search relevance: 28.02 | Views last month: 0 -
Technical papers detailing the development of harsh environment sensors for geothermal applications. Principle Investigator is Prof. Albert P. Pisano (University of California, Berkeley)....
Search relevance: 26.64 | Views last month: 0 -
The NIST Electron Inelastic-Mean-Free-Path Database provides values of electron inelastic mean free paths (IMFPs) principally for use in surface analysis by Auger-electron spectroscopy and X-ray...
Search relevance: 25.89 | Views last month: 4 -
Carbon nanotubes (CNTs) have great potential in industrial, consumer, and mechanical applications, based partly on their unique structural, optical and electronic properties. CNTs are commonly...
Search relevance: 21.86 | Views last month: 0 -
The NIST Database for the Simulation of Electron Spectra for Surface Analysis (SESSA) can be used to simulate Auger-electron spectra and X-ray photoelectron spectra of nanostructures such as...
Search relevance: 21.46 | Views last month: 0
