Found 6 datasets matching "igbt".
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Precursor parameters have been identified to enable development of a prognostic approach for insulated gate bipolar transistors (IGBT). The IGBT were subjected to thermal over- stress tests using...
Search relevance: 127.74 | Views last month: 0 -
Precursor parameters have been identified to enable development of a prognostic approach for insulated gate bipolar transistors (IGBT). The IGBT were subjected to thermal overstress tests using a...
Search relevance: 118.05 | Views last month: 1 -
Preliminary data from thermal overstress accelerated aging using the aging and characterization system. The data set contains aging data from 6 devices, one device aged with DC gate bias and the...
Search relevance: 92.86 | Views last month: 0 -
Preliminary data from thermal overstress accelerated aging using the aging and characterization system. The data set contains aging data from 6 devices, one device aged with DC gate bias and the...
Search relevance: 72.87 | Views last month: 2 -
Electronics components have an increasingly critical role in avionics systems and in the development of future aircraft systems. Prognostics of such components is becoming a very important...
Search relevance: 47.92 | Views last month: 1 -
This article reports on preliminary results of a study conducted to examine how temporary electrical overstress seed fault conditions in discrete power electronic components that cannot be...
Search relevance: 34.83 | Views last month: 0
