• Organization: National Institute of Standards and Technology
• Updated: 2010-12-01 00:00:00

The NIST Electron Inelastic-Mean-Free-Path Database provides values of electron inelastic mean free paths (IMFPs) principally for use in surface analysis by Auger-electron spectroscopy and X-ray...

• html
• html

• Organization: National Institute of Standards and Technology
• Updated: 2014-11-01 00:00:00

The NIST Database for the Simulation of Electron Spectra for Surface Analysis (SESSA) can be used to simulate Auger-electron spectra and X-ray photoelectron spectra of nanostructures such as...

• html