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Found 6 datasets matching "microwave metrology".

Federal
Data for "Using Commercial Source Measure Units for Traceable RF Power Measurements" for the 2024 ARFTG conference in Washington, DC.
- Organization: National Institute of Standards and Technology
- Updated: 2024-04-01 00:00:00
As a National Metrology Institute (NMI), the National Institute of Standards and Technology (NIST) maintains traceable measurement capabilities for a variety of quantities, including microwave...
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Search relevance: 57.83 | Views last month: 0
Federal
Data associated with "Characterizing the broadband RF permittivity of 3D-integrated layers in a glass wafer stack from 100 MHz to 30 GHz" for the 2024 International Microwave Symposium (IMS) in Washington, D.C.
- Organization: National Institute of Standards and Technology
- Updated: 2023-11-17 00:00:00
We present a method for accurately determining the permittivity of dielectric materials in 3D integrated structures at broadband RF frequencies. With applications of microwave and millimeter-wave...
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Search relevance: 55.07 | Views last month: 0
Federal
Data for Plots in Work with Title: A Measurement-Referenced Error Vector Magnitude for Counterfeit Cellular Device Detection
- Organization: National Institute of Standards and Technology
- Updated: 2023-01-18 00:00:00
The raw data from this experiment are recorded voltage waveforms versus time from a calibrated equivalent time sampling oscilloscope, touchstone files from network analysis, and waveforms in both...
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Search relevance: 51.42 | Views last month: 0
Federal
Cryogenic On-chip In Situ S-parameter Calibration Using Superconducting Coplanar Waveguides
- Organization: National Institute of Standards and Technology
- Updated: 2025-06-30 00:00:00
These data will appear in [1]. The abstract for that paper is given below:This paper presents a new multi-impedance-state line (MISL) in situ scattering parameter (S-parameter) calibration...
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Search relevance: 50.83 | Views last month: 0
Federal
AC Metrology Applications of the Josephson Effect
- Organization: National Institute of Standards and Technology
- Updated: 2024-05-07 00:00:00
Datasets for the four published figures in the Paper "AC Metrology Applications of the Josephson Effect ". This paper is being submitted to Applied Physics Letters Special Topic, "Advances in...
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Search relevance: 50.03 | Views last month: 0
Federal
Dataset for A Robust, Over-the-Air Test Bed for Radio-Frequency Fingerprinting of Cellular Devices
- Organization: National Institute of Standards and Technology
- Updated: 2024-11-04 00:00:00
This dataset contains results represented in the work titled 'A Robust, Over-the-Air Test Bed for Radio-Frequency Fingerprinting of Cellular Devices', whose abstract sample is below. We present a...
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Search relevance: 48.47 | Views last month: 1

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Data for "Using Commercial Source Measure Units for Traceable RF Power Measurements" for the 2024 ARFTG conference in Washington, DC.

Data associated with "Characterizing the broadband RF permittivity of 3D-integrated layers in a glass wafer stack from 100 MHz to 30 GHz" for the 2024 International Microwave Symposium (IMS) in Washington, D.C.

Data for Plots in Work with Title: A Measurement-Referenced Error Vector Magnitude for Counterfeit Cellular Device Detection

Cryogenic On-chip In Situ S-parameter Calibration Using Superconducting Coplanar Waveguides

AC Metrology Applications of the Josephson Effect

Dataset for A Robust, Over-the-Air Test Bed for Radio-Frequency Fingerprinting of Cellular Devices