• Organization: National Institute of Standards and Technology
• Updated: 2024-01-23 00:00:00

data published in paper "On-Wafer Device Characterization Including Uncertainty Estimates to 1.0 THz"This dataset contains the calibrated scattering parameters (S-parameters) of a thru that was...

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• Organization: National Institute of Standards and Technology
• Updated: 2023-09-21 00:00:00

Included here are figures and other relevant data from the paper "Characterizing Interconnects to 325 GHz". Abstract: We developed an interconnect characterization procedure that first embeds the...

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• Organization: National Institute of Standards and Technology
• Updated: 2024-06-10 00:00:00

Abstract from manuscript:We demonstrate a glass microwave microfluidic device for determining the permittivity of a wide range of liquid chemicals from 100 MHz to 10 GHz with relatively low...

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• Organization: National Institute of Standards and Technology
• Updated: 2023-06-29 00:00:00

Fused silica has become an interesting alternative to silicon for millimeter-wave (mmWave) applications. Unfortunately, there are few reports on the measurement of fused silica’s permittivity...

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