• Organization: National Institute of Standards and Technology
• Updated: 2012-10-10 00:00:00

NIST X-ray Photoelectron Spectroscopy Database XPS contains over 33,000 data records that can be used for the identification of unknown lines, retrieval of data for selected elements (binding...

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• Organization: National Institute of Standards and Technology
• Updated: 2022-04-25 00:00:00

This dataset supports the manuscript " Interface formation and Schottky barrier height for Y, Nb, Au, and Pt on Ge as determined by hard x-ray photoelectron spectroscopy", and consists of two...

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• Organization: National Institute of Standards and Technology
• Updated: 2010-12-01 00:00:00

The NIST Electron Inelastic-Mean-Free-Path Database provides values of electron inelastic mean free paths (IMFPs) principally for use in surface analysis by Auger-electron spectroscopy and X-ray...

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• Organization: National Institute of Standards and Technology
• Updated: 2012-01-01 00:00:00

Note that this SRD supersedes SRD 64 Version 3.2. The NIST Electron Elastic-Scattering Cross-Section Database provides values of differential elastic-scattering cross sections, total...

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• Organization: National Institute of Standards and Technology
• Updated: 2012-01-01 00:00:00

**** Note that this SRD is superseded by SRD 64 Version 4.0. ****The NIST Electron Elastic-Scattering Cross-Section Database provides values of differential elastic-scattering cross sections,...

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• Organization: U.S. Environmental Protection Agency
• Updated: 2023-05-29

Heavy metal sorption data. Material characterization using scanning electron microscopy (SEM, Hitachi SU8020, Japan) and energy spectrometry (EDS), Fourier transform infrared (FTIR, Nichlet IS...

• Organization: National Institute of Standards and Technology
• Updated: 2011-01-01 00:00:00

The NIST Electron Effective Attenuation Length Database provides values of electron effective attenuation lengths (EALs) in materials at user-selected electron energies between 50 eV and 2,000 eV....

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• Organization: National Institute of Standards and Technology
• Updated: 2007-06-01 00:00:00

CO2 is studied using dispersed synchrotron radiation in the 650 Å and 840 Å spectral region. The vibrationally resolved photoelectron spectra are analyzed to generate relative vibrational...

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• Organization: National Institute of Standards and Technology
• Updated: 2018-01-25 00:00:00

These data are supplemental data that include digital holographic microscopy measurements of nanoscale surface topography changes occurring during the dissolution of beta-dicalcium silicate in...

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• Organization: U.S. Environmental Protection Agency
• Updated: 2016-09-05

The results demonstrate the Ag 3d5/2-3/2 spectrum of the pristine AgNPs. Furthermore, the XAS spectra from the analysis of the nanosilver solution (ASAP-AGX-32) after the disinfection process is...

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• Organization: National Institute of Standards and Technology
• Updated: 2014-11-01 00:00:00

The NIST Database for the Simulation of Electron Spectra for Surface Analysis (SESSA) can be used to simulate Auger-electron spectra and X-ray photoelectron spectra of nanostructures such as...

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• Organization: Department of the Interior
• Updated: 2026-01-21T00:00:00Z

Conventional methods of assessing organic matter (OM) thermal maturity have limitations and often fail to reflect the geochemical heterogeneity between individual organic phases in mudstone...

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