• Organization: National Institute of Standards and Technology
• Updated: 2014-05-22 00:00:00

This MEMS Calculator determines the following thin film properties from data taken with an optical interferometer or comparable instrument: a) residual strain from fixed-fixed beams, b) strain...

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• Organization: National Institute of Standards and Technology
• Updated: 2025-01-30 00:00:00

This repository contains data generated to support and ECTC 2025 conference manuscript titled "Advanced Metrology Suite for Linking Residual Stress to Fundamental Properties of Thermoset Packaging...

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