Found 11 datasets matching "x-ray photoelectron spectroscopy".
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NIST X-ray Photoelectron Spectroscopy Database XPS contains over 33,000 data records that can be used for the identification of unknown lines, retrieval of data for selected elements (binding...
Search relevance: 372.70 | Views last month: 3 -
This dataset supports the manuscript " Interface formation and Schottky barrier height for Y, Nb, Au, and Pt on Ge as determined by hard x-ray photoelectron spectroscopy", and consists of two...
Search relevance: 354.37 | Views last month: 0 -
The NIST Electron Inelastic-Mean-Free-Path Database provides values of electron inelastic mean free paths (IMFPs) principally for use in surface analysis by Auger-electron spectroscopy and X-ray...
Search relevance: 201.19 | Views last month: 4 -
**** Note that this SRD is superseded by SRD 64 Version 4.0. ****The NIST Electron Elastic-Scattering Cross-Section Database provides values of differential elastic-scattering cross sections,...
Search relevance: 187.30 | Views last month: 0 -
Note that this SRD supersedes SRD 64 Version 3.2. The NIST Electron Elastic-Scattering Cross-Section Database provides values of differential elastic-scattering cross sections, total...
Search relevance: 180.57 | Views last month: 2 -
Heavy metal sorption data. Material characterization using scanning electron microscopy (SEM, Hitachi SU8020, Japan) and energy spectrometry (EDS), Fourier transform infrared (FTIR, Nichlet IS...
Search relevance: 122.39 | Views last month: 2 -
The results demonstrate the Ag 3d5/2-3/2 spectrum of the pristine AgNPs. Furthermore, the XAS spectra from the analysis of the nanosilver solution (ASAP-AGX-32) after the disinfection process is...
Search relevance: 102.94 | Views last month: 0 -
CO2 is studied using dispersed synchrotron radiation in the 650 Å and 840 Å spectral region. The vibrationally resolved photoelectron spectra are analyzed to generate relative vibrational...
Search relevance: 102.52 | Views last month: 0 -
The NIST Electron Effective Attenuation Length Database provides values of electron effective attenuation lengths (EALs) in materials at user-selected electron energies between 50 eV and 2,000 eV....
Search relevance: 97.05 | Views last month: 0 -
These data are supplemental data that include digital holographic microscopy measurements of nanoscale surface topography changes occurring during the dissolution of beta-dicalcium silicate in...
Search relevance: 93.30 | Views last month: 0 -
The NIST Database for the Simulation of Electron Spectra for Surface Analysis (SESSA) can be used to simulate Auger-electron spectra and X-ray photoelectron spectra of nanostructures such as...
Search relevance: 76.75 | Views last month: 0