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Code for SerialTrack-XR particle tracking

Published by National Institute of Standards and Technology | National Institute of Standards and Technology | Metadata Last Checked: August 02, 2025 | Last Modified: 2023-11-27 00:00:00

This repository contains scripts for running a custom implementation of "SerialTrack" designed for 2D X-ray projection images taken during in situ micro-X-ray computed tomography (XCT) experiments. The particle tracking-based technique allows for surface displacement and strain fields to be measured during, for example, mini-tensile test motions. This provides quantitative visualization of non-uniformities in the strain field (i.e., necking, shear banding), direct measurement of applied strain to supplement crosshead-based data, and quantification of system drift, among other uses. The code is written in Matlab and developed under Releases 2021b - 2023b under Windows 10. In total the dataset consists of about 250 MB and 79 files.

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@type	dcat:Dataset
accessLevel	public
accrualPeriodicity	irregular
bureauCode	[ "006:55" ]
contactPoint	{ "fn": "Alexander Landauer", "hasEmail": "mailto:alexander.landauer@nist.gov" }
description	This repository contains scripts for running a custom implementation of "SerialTrack" designed for 2D X-ray projection images taken during in situ micro-X-ray computed tomography (XCT) experiments. The particle tracking-based technique allows for surface displacement and strain fields to be measured during, for example, mini-tensile test motions. This provides quantitative visualization of non-uniformities in the strain field (i.e., necking, shear banding), direct measurement of applied strain to supplement crosshead-based data, and quantification of system drift, among other uses. The code is written in Matlab and developed under Releases 2021b - 2023b under Windows 10. In total the dataset consists of about 250 MB and 79 files.
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identifier	ark:/88434/mds2-3118
issued	2023-12-07
keyword	[ "Particle tracking", "Surface strain measurement", "X-ray micro Computed Tomography" ]
landingPage	https://data.nist.gov/od/id/mds2-3118
language	[ "en" ]
license	https://www.nist.gov/open/license
modified	2023-11-27 00:00:00
programCode	[ "006:045" ]
publisher	{ "name": "National Institute of Standards and Technology", "@type": "org:Organization" }
replaces	ark:/88434/mds2-3118
theme	[ "Materials:Materials characterization", "Mathematics and Statistics:Image and signal processing", "Metrology:Dimensional metrology", "Metrology:Optical, photometry, and laser metrology" ]
title	Code for SerialTrack-XR particle tracking