Diffraction Data for SRM 640f
The data from this instrument consists of sets of measurements of Xray intensity as a function of diffraction angle. Almost all of it is collected using a position-sensitive detector (PSD), and is stored in CIF format.
Complete Metadata
| @type | dcat:Dataset |
|---|---|
| accessLevel | public |
| bureauCode |
[
"006:55"
]
|
| contactPoint |
{
"fn": "David R. Black",
"hasEmail": "mailto:srms@nist.gov"
}
|
| description | The data from this instrument consists of sets of measurements of Xray intensity as a function of diffraction angle. Almost all of it is collected using a position-sensitive detector (PSD), and is stored in CIF format. |
| distribution |
[
{
"title": "DOI Access for Diffraction Data for SRM 640f",
"accessURL": "https://doi.org/10.18434/M32251"
},
{
"title": "Diffraction Data for SRM 640f",
"mediaType": "application/x-zip-compressed",
"description": "X-ray diffraction data expressed as intensity as a function of angle",
"downloadURL": "https://data.nist.gov/od/ds/mds2-2251/srm640f_cifs_20200601a.zip"
},
{
"title": "SHA256 File for Diffraction Data for SRM 640f",
"mediaType": "text/plain",
"downloadURL": "https://data.nist.gov/od/ds/mds2-2251/srm640f_cifs_20200601a.zip.sha256"
}
]
|
| identifier | ark:/88434/mds2-2251 |
| issued | 2020-06-22 |
| keyword |
[
"Xray Powder Diffraction; Diverging Beam Diffractometer; Powder Diffraction SRM"
]
|
| landingPage | https://data.nist.gov/od/id/mds2-2251 |
| language |
[
"en"
]
|
| license | https://www.nist.gov/open/license |
| modified | 2020-06-01 00:00:00 |
| programCode |
[
"006:045"
]
|
| publisher |
{
"name": "National Institute of Standards and Technology",
"@type": "org:Organization"
}
|
| theme |
[
"Materials:Materials characterization"
]
|
| title | Diffraction Data for SRM 640f |
