Effects of Lightning Injection on Power-MOSFETs
Lightning induced damage is one of the major concerns in aircraft health monitoring. Such short-duration high voltages can cause significant damage to electronic devices. This paper presents a study on the effects of lightning injection on power metal-oxide semiconductor field effect transistors (MOSFETs). This approach consisted of pin- injecting lightning waveforms into the gate, drain and/or source of MOSFET devices while they were in the OFF-state. Analysis of the characteristic curves of the devices showed that for certain injection modes the devices can accumulate considerable damage rendering them inoperable. Early results demonstrate that a power MOSFET, even in its off-state, can incur considerable damage due to lightning pin injection, leading to significant deviation in its behavior and performance, and to possibly early device failures.
Complete Metadata
| @type | dcat:Dataset |
|---|---|
| accessLevel | public |
| accrualPeriodicity | irregular |
| bureauCode |
[
"026:00"
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| contactPoint |
{
"fn": "Miryam Strautkalns",
"@type": "vcard:Contact",
"hasEmail": "mailto:miryam.strautkalns@nasa.gov"
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|
| description | Lightning induced damage is one of the major concerns in aircraft health monitoring. Such short-duration high voltages can cause significant damage to electronic devices. This paper presents a study on the effects of lightning injection on power metal-oxide semiconductor field effect transistors (MOSFETs). This approach consisted of pin- injecting lightning waveforms into the gate, drain and/or source of MOSFET devices while they were in the OFF-state. Analysis of the characteristic curves of the devices showed that for certain injection modes the devices can accumulate considerable damage rendering them inoperable. Early results demonstrate that a power MOSFET, even in its off-state, can incur considerable damage due to lightning pin injection, leading to significant deviation in its behavior and performance, and to possibly early device failures. |
| distribution |
[
{
"@type": "dcat:Distribution",
"title": "2009_PHM_Lightning.pdf",
"format": "PDF",
"mediaType": "application/pdf",
"description": "2009_PHM_Lightning.pdf",
"downloadURL": "https://c3.nasa.gov/dashlink/static/media/publication/2009_PHM_Lightning.pdf"
}
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|
| identifier | DASHLINK_767 |
| issued | 2013-06-19 |
| keyword |
[
"ames",
"dashlink",
"nasa"
]
|
| landingPage | https://c3.nasa.gov/dashlink/resources/767/ |
| modified | 2025-03-31 |
| programCode |
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"026:029"
]
|
| publisher |
{
"name": "Dashlink",
"@type": "org:Organization"
}
|
| title | Effects of Lightning Injection on Power-MOSFETs |
