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GOES-R Series Level 1b EXIS Extreme Ultraviolet Sensor (EUVS) Product in Daily Aggregations

Published by NOAA National Centers for Environmental Information | National Oceanic and Atmospheric Administration, Department of Commerce | Metadata Last Checked: December 19, 2025 | Last Modified: 2018-07-18T00:00:00.000+00:00
The GOES-R Extreme Ultraviolet and X-Ray Irradiance Sensors (EXIS) Extreme Ultraviolet Sensor (EUVS) measures solar spectral irradiance at discrete wavelengths between 25 and 141 nm and in the vicinity of 280 nm. GOES-R EUVS makes extreme ultraviolet (EUV) and far ultraviolet (FUV) high-spectral-resolution measurements of distinct solar emission lines representative of different layers of the solar atmosphere. The L1b data products derived from EUVS observations are irradiances for seven solar lines, the Magnesium core-to-wing ratio (i.e., the Mg II index), and EUV proxy spectra from 5 to 127 nm. The nominal data cadence is 30-seconds.

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