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GOES-R Series Level 1b EXIS X-Ray Sensor (XRS) Product in Daily Aggregations

Published by NOAA National Centers for Environmental Information | National Oceanic and Atmospheric Administration, Department of Commerce | Metadata Last Checked: December 19, 2025 | Last Modified: 2018-07-18T00:00:00.000+00:00
The EUV and X-Ray Irradiance Sensors (EXIS) measures solar irradiance at the very short wavelengths where the Sun's output varies the most. The GOES-R Extreme Ultraviolet and X-Ray Irradiance Sensors (EXIS) X-Ray Sensor (XRS) Level 1b (L1b) Science-Quality data contains 1-second cadence soft X-Ray irradiance measurements covering 0.05-0.4 nm and 0.1-0.8 nm integrated passbands. EXIS was designed and built by the Laboratory for Atmospheric and Space Physics (LASP) at the University of Colorado Boulder. This science-quality dataset is produced by NOAA’s National Centers for Environmental Information (NCEI) and utilizes code provided by LASP, and differs from the L1b operational product used at the NOAA Space Weather Prediction Center (SWPC) in that it incorporates retrospective fixes for issues in the operational product and uses the most recent calibrations.

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