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IGBT accelerated aging data set.
Preliminary data from thermal overstress accelerated aging using the aging and characterization system. The data set contains aging data from 6 devices, one device aged with DC gate bias and the rest aged with a squared signal gate bias. Several variables are recorded and in some cases, high-speed measurements of gate voltage, collector-emitter voltage and collector current are available. The data set is provided by the Prognostics CoE at NASA Ames.
Complete Metadata
| @type | dcat:Dataset |
|---|---|
| accessLevel | public |
| accrualPeriodicity | irregular |
| bureauCode |
[
"026:00"
]
|
| contactPoint |
{
"fn": "Nikunj Oza",
"@type": "vcard:Contact",
"hasEmail": "mailto:Nikunj.C.Oza@nasa.gov"
}
|
| description | Preliminary data from thermal overstress accelerated aging using the aging and characterization system. The data set contains aging data from 6 devices, one device aged with DC gate bias and the rest aged with a squared signal gate bias. Several variables are recorded and in some cases, high-speed measurements of gate voltage, collector-emitter voltage and collector current are available. The data set is provided by the Prognostics CoE at NASA Ames. |
| identifier | DASHLINK_134 |
| issued | 2010-09-13 |
| keyword |
[
"ames",
"dashlink",
"nasa"
]
|
| landingPage | https://c3.nasa.gov/dashlink/resources/134/ |
| modified | 2025-07-17 |
| programCode |
[
"026:029"
]
|
| publisher |
{
"name": "Dashlink",
"@type": "org:Organization"
}
|
| title | IGBT accelerated aging data set. |
