InGaAs Trap Detector: Advancing Toward a Short-Wave Infrared Standard with 1% Uncertainty
No additional requirements: Working data, derived data (OISM-provided Level 1 storage) Individual user responsibility: Publishable results, Published results (OISM-provided, Level 2 storage) Not available to the public: Working data, derived data (experimental raw data), and publishable results. Made available to the public as described below: Published results that appear in publicly accessible reports, such as in journals and conference proceedings.
Complete Metadata
| @type | dcat:Dataset |
|---|---|
| accessLevel | public |
| accrualPeriodicity | irregular |
| bureauCode |
[
"006:55"
]
|
| contactPoint |
{
"fn": "Anouar Rahmouni",
"hasEmail": "mailto:anouar.rahmouni@nist.gov"
}
|
| description | No additional requirements: Working data, derived data (OISM-provided Level 1 storage) Individual user responsibility: Publishable results, Published results (OISM-provided, Level 2 storage) Not available to the public: Working data, derived data (experimental raw data), and publishable results. Made available to the public as described below: Published results that appear in publicly accessible reports, such as in journals and conference proceedings. |
| distribution |
[
{
"title": "README",
"mediaType": "application/vnd.openxmlformats-officedocument.wordprocessingml.document",
"downloadURL": "https://data.nist.gov/od/ds/mds2-3677/README.docx"
},
{
"title": "dataset",
"mediaType": "application/zip",
"downloadURL": "https://data.nist.gov/od/ds/mds2-3677/dataset.zip"
}
]
|
| identifier | ark:/88434/mds2-3677 |
| issued | 2025-03-20 |
| keyword |
[
"Calibration",
"InGaAs photodiode.",
"Trap detector",
"metrology"
]
|
| landingPage | https://data.nist.gov/od/id/mds2-3677 |
| language |
[
"en"
]
|
| license | https://www.nist.gov/open/license |
| modified | 2025-01-02 00:00:00 |
| programCode |
[
"006:045"
]
|
| publisher |
{
"name": "National Institute of Standards and Technology",
"@type": "org:Organization"
}
|
| theme |
[
"Metrology:Optical, photometry, and laser metrology"
]
|
| title | InGaAs Trap Detector: Advancing Toward a Short-Wave Infrared Standard with 1% Uncertainty |
