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NIST NIST Backscattering-Correction-Factor Database for Auger Electron Spectroscopy - SRD 154
This database provides values of backscattering correction factors (BCF) of homogeneous materials for quantitative surface analyses by Auger electron spectroscopy. These BCFs are obtained from Monte Carlo simulations based on two models of electron transport in the material, a simplified model and an advanced model [A. Jablonski and C. J. Powell, Surf. Science 604, 1928 (2010)]. One assumption for the former model is that the primary-electron beam is unchanged, in intensity, energy or direction, within the information depth for Auger-electron emission. This assumption becomes progressively less useful as the primary energy becomes closer to the core-level ionization energy for the relevant Auger transition or for increasing angles of incidence of the primary electrons.
Complete Metadata
| @type | dcat:Dataset |
|---|---|
| accessLevel | public |
| accrualPeriodicity | irregular |
| bureauCode |
[
"006:55"
]
|
| contactPoint |
{
"fn": "Justin Gorham",
"@type": "vcard:Contact",
"hasEmail": "mailto:justin.gorham@nist.gov"
}
|
| description | This database provides values of backscattering correction factors (BCF) of homogeneous materials for quantitative surface analyses by Auger electron spectroscopy. These BCFs are obtained from Monte Carlo simulations based on two models of electron transport in the material, a simplified model and an advanced model [A. Jablonski and C. J. Powell, Surf. Science 604, 1928 (2010)]. One assumption for the former model is that the primary-electron beam is unchanged, in intensity, energy or direction, within the information depth for Auger-electron emission. This assumption becomes progressively less useful as the primary energy becomes closer to the core-level ionization energy for the relevant Auger transition or for increasing angles of incidence of the primary electrons. |
| distribution |
[
{
"title": "DOI Access to NIST Backscattering Correction Factor Database for Auger Electron Spectroscopy",
"format": "text/html",
"accessURL": "https://dx.doi.org/10.18434/T4JG6D",
"mediaType": "text/html",
"description": "DOI Access to NIST Backscattering Correction Factor Database for Auger Electron Spectroscopy"
},
{
"title": "Form to download the database",
"accessURL": "https://www-s.nist.gov/srd_online/index.cfm?fuseaction=home.main&productID=SRD154",
"description": "This database is free, but requires that a form be filled out in order to be able to download."
}
]
|
| identifier | ECBCC1C1300B2ED9E04306570681B10717 |
| keyword |
[
"Auger electron spectroscopy",
"backscattering correction factor",
"surface analysis"
]
|
| landingPage | https://www.nist.gov/srd/nist-standard-reference-database-154 |
| language |
[
"en"
]
|
| license | https://www.nist.gov/open/license |
| modified | 2015-07-01 00:00:00 |
| programCode |
[
"006:052"
]
|
| publisher |
{
"name": "National Institute of Standards and Technology",
"@type": "org:Organization"
}
|
| references |
[
"https://dx.doi.org/10.1016/j.susc.2010.07.030",
"https://www.nist.gov/system/files/documents/2017/06/27/srd_154_users_guide_version_1.1.pdf"
]
|
| theme |
[
"Standards:Reference data"
]
|
| title | NIST NIST Backscattering-Correction-Factor Database for Auger Electron Spectroscopy - SRD 154 |
