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OIG Investigation Into Alleged Time and Attendance Abuse by a Patent Examiner
OIG investigation into time and attendance abuse by a patent examiner
Complete Metadata
| @type | dcat:Dataset |
|---|---|
| accessLevel | public |
| bureauCode |
[
"006:05"
]
|
| contactPoint |
{
"fn": "webmaster",
"@type": "vcard:Contact",
"hasEmail": "mailto:oigwebmaster@oig.doc.gov"
}
|
| description | OIG investigation into time and attendance abuse by a patent examiner |
| distribution |
[
{
"@type": "dcat:Distribution",
"title": "OIG investigation into Alleged time and Attendance abuse by a Patent Examiner",
"accessURL": "https://www.oig.doc.gov/Pages/OIG-Investigation-into-Alleged-Time-and-Attendance-Abuse-by-a-Patent-Examiner.aspx",
"description": "Department of Commerce OIG investigation into alleged time and attendance abuse by a Patent Examiner"
}
]
|
| identifier | doc-0001-b |
| keyword |
[
"OIG Investigation Patent examiner",
"Time and attendance abuse investigation"
]
|
| license | https://www.usa.gov/publicdomain/label/1.0/ |
| modified | 2015-08-19 |
| programCode |
[
"006:020"
]
|
| publisher |
{
"name": "Office of Inspector General",
"@type": "org:Organization"
}
|
| title | OIG Investigation Into Alleged Time and Attendance Abuse by a Patent Examiner |
