SEM Images of Thin Sections of Sinter Samples from the Upper Geyser Basin in Yellowstone National Park (2019)
Sample Analyses: Thin sections made at UC Berkeley were brought to the USGS, Menlo Park, CA and were coated with 25 nm carbon. Samples were analyzed at the USGS in Menlo Park, CA in a Tescan VEGA3 Scanning Electron Microscope (SEM) equipped with an Oxford 50 mm2 X-MaxN energy dispersive spectrometer. Thin sections were imaged with backscatter electrons.
Database Contents: The data files for “SEM Images of Sinter Thin Sections” contain representative SEM images of thin sections of samples UGB-TD-24, -27, -28, -29, -31, -32.
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| description | Sample Analyses: Thin sections made at UC Berkeley were brought to the USGS, Menlo Park, CA and were coated with 25 nm carbon. Samples were analyzed at the USGS in Menlo Park, CA in a Tescan VEGA3 Scanning Electron Microscope (SEM) equipped with an Oxford 50 mm2 X-MaxN energy dispersive spectrometer. Thin sections were imaged with backscatter electrons. Database Contents: The data files for “SEM Images of Sinter Thin Sections” contain representative SEM images of thin sections of samples UGB-TD-24, -27, -28, -29, -31, -32. |
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| modified | 2020-08-31T00:00:00Z |
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| title | SEM Images of Thin Sections of Sinter Samples from the Upper Geyser Basin in Yellowstone National Park (2019) |
