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Supplementary data from the NIST lattice comparator associated with paper "The NIST Silicon Lattice Comparator Upgrade"

Published by National Institute of Standards and Technology | National Institute of Standards and Technology | Metadata Last Checked: August 02, 2025 | Last Modified: 2023-01-18 00:00:00
The data from this instrument consists of sets of measurements of Xray intensity as a function of diffraction angle. All of it is collected and is stored in JSON files. The files are highly self-descriptive of their content, and contain angles, intensities, temperatures, and other environmental parameters, along with metadata.

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