Found 3 datasets matching "CHIPS metrology".
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The dataset consists of six collections of SEM images, three trained U-net AI models, and CSV files with image quality metrics and trained AI model accuracy metrics. Each SEM image collection...
Search relevance: 80.52 | Views last month: 29 -
We present a method for accurately determining the permittivity of dielectric materials in 3D integrated structures at broadband RF frequencies. With applications of microwave and millimeter-wave...
Search relevance: 58.34 | Views last month: 0 -
The data are associated with figures in A. P. Kotula, R. Tao, J. Tu, Y. Lee, G. A. Holmes, Advanced Characterization of the Cure Kinetics of a Liquid Encapsulant, 2025 IEEE 75th Electronic...
Search relevance: 57.84 | Views last month: 2
