• Organization: National Institute of Standards and Technology
• Updated: 2023-12-04 00:00:00

We plan to present a technique for implementing a frequency doubler in NbTiN on silicon for operation in a cryogenic environment at IMS 2024. The kinetic inductance of a superconducting coplanar...

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• Organization: National Institute of Standards and Technology
• Updated: 2024-04-26 00:00:00

Dataset for publishable figures in a "On-Chip Frequency Conversion Using Kinetic Inductance Within a Coplanar Waveguide" manuscript to be submitted to IEEE Transactions on Applied...

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• Organization: National Institute of Standards and Technology
• Updated: 2023-06-29 00:00:00

Fused silica has become an interesting alternative to silicon for millimeter-wave (mmWave) applications. Unfortunately, there are few reports on the measurement of fused silica’s permittivity...

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• Organization: National Institute of Standards and Technology
• Updated: 2023-05-22 00:00:00

DyScO3 (DSO) serves as a substrate on which to grow epitaxial thin films with extraordinary materials physics. The film properties are determined by the biaxial in-plane strain due to DyScO3's...

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• Organization: National Institute of Standards and Technology
• Updated: 2023-09-21 00:00:00

Included here are figures and other relevant data from the paper "Characterizing Interconnects to 325 GHz". Abstract: We developed an interconnect characterization procedure that first embeds the...

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• Organization: National Institute of Standards and Technology
• Updated: 2023-06-08 00:00:00

Data published in paper "Microstrip and Grounded CPW Calibration Kit Comparison for On-Wafer Transistor Characterization from 220 GHz to 325 GHz"We investigated the effect of two uncertainty...

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• Organization: National Institute of Standards and Technology
• Updated: 2024-01-23 00:00:00

data published in paper "On-Wafer Device Characterization Including Uncertainty Estimates to 1.0 THz"This dataset contains the calibrated scattering parameters (S-parameters) of a thru that was...

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• Organization: National Institute of Standards and Technology
• Updated: 2025-06-30 00:00:00

These data will appear in [1]. The abstract for that paper is given below:This paper presents a new multi-impedance-state line (MISL) in situ scattering parameter (S-parameter) calibration...

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• Organization: National Institute of Standards and Technology
• Updated: 2024-02-23 00:00:00

These data will appear in [1]. The abstract for that paper is given below:We report on the design, fabrication, and measurement of a Very High Frequency band Josephson Arbitrary Waveform...

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• Organization: National Institute of Standards and Technology
• Updated: 2023-01-17 00:00:00

Figures and relevant data from the paper "Broadband Electromagnetic Properties of Engineered Flexible Absorber Materials" are found here . The paper was published on Advanced Materials...

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