• Organization: National Institute of Standards and Technology
• Updated: 2013-07-05 00:00:00

OOF is software for analyzing the properties of materials with complex microstructures. Starting with a micrograph of a real or simulated material, OOF allows users to assign material properties...

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• Organization: National Institute of Standards and Technology
• Updated: 2025-05-08 00:00:00

The following optical micrograph data files are provided in support of the AM Bench 2018 modeling challenges associated with bare plate single track laser scans performed on the NIST Additive...

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• Organization: National Institute of Standards and Technology
• Updated: 2021-08-26 00:00:00

SRM 3461 is an AFM sized chip with an array of seven cantilevers on each chip. The uniformity of the chips offered for sale from wafer 2 is excellent and the SRM certificate reports values and...

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• Organization: Department of Agriculture
• Updated: 2025-12-19

The dataset contains micrographs of Hoplolaimus, Helicotylenchus, Meloidogyne, Mesocriconema, Pratylenchus, Trichodorus, and Tylenchorhynchus nematodes. The data were collected using 10×, 20×...

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• Organization: U.S. Department of Health & Human Services
• Updated: 2025-09-29

This year marks the 100th anniversary of the discovery by Camillo Golgi of an “internal reticular apparatus” in eukaryotic cells. The cover figure, from a classic paper by Friend and Murray...

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