Return to search results
Insulated-Gate Bipolar Transistor (IGBT) Accelerated Aging
Preliminary data from thermal overstress accelerated aging using the aging and characterization system. The data set contains aging data from 6 devices, one device aged with DC gate bias and the rest aged with a squared signal gate bias. Several variables are recorded and, in some cases, high-speed measurements of gate voltage, collector-emitter voltage, and collector current are available. The data set is provided by the NASA Prognostics Center of Excellence (PCoE).
Complete Metadata
| @type | dcat:Dataset |
|---|---|
| accessLevel | public |
| bureauCode |
[
"026:00"
]
|
| contactPoint |
{
"fn": "Christopher Teubert",
"@type": "vcard:Contact",
"hasEmail": "mailto:Christopher.A.Teubert@nasa.gov"
}
|
| description | Preliminary data from thermal overstress accelerated aging using the aging and characterization system. The data set contains aging data from 6 devices, one device aged with DC gate bias and the rest aged with a squared signal gate bias. Several variables are recorded and, in some cases, high-speed measurements of gate voltage, collector-emitter voltage, and collector current are available. The data set is provided by the NASA Prognostics Center of Excellence (PCoE). |
| distribution |
[
{
"@type": "dcat:Distribution",
"title": "IGBTAgingData_04022009.zip",
"format": "ZIP",
"mediaType": "application/zip",
"downloadURL": "https://data.nasa.gov/docs/legacy/IGBTAgingData_04022009.zip"
}
]
|
| identifier | https://data.nasa.gov/api/views/7wwx-fk77 |
| issued | 2022-11-22 |
| keyword |
[
"accelerated-aging",
"degradation",
"igbt",
"insulated-gate-bipolar-transistor",
"phm",
"prognostics",
"semiconductor",
"transistor"
]
|
| landingPage | https://data.nasa.gov/dataset/insulated-gate-bipolar-transistor-igbt-accelerated-aging |
| license | https://www.usa.gov/government-works |
| modified | 2025-05-29 |
| programCode |
[
"026:021"
]
|
| publisher |
{
"name": "PCoE",
"@type": "org:Organization"
}
|
| theme |
[
"Raw Data"
]
|
| title | Insulated-Gate Bipolar Transistor (IGBT) Accelerated Aging |
