• Organization: National Institute of Standards and Technology
• Updated: 2023-12-08 00:00:00

Here are included figures and other relevant data from the paper "On-Wafer Calibration Comparisons of Multiline TRL with Platinum and Gold Conductors" to be published in International Microwave...

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• Organization: National Institute of Standards and Technology
• Updated: 2023-06-08 00:00:00

Data published in paper "Microstrip and Grounded CPW Calibration Kit Comparison for On-Wafer Transistor Characterization from 220 GHz to 325 GHz"We investigated the effect of two uncertainty...

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• Organization: National Institute of Standards and Technology
• Updated: 2024-07-10 00:00:00

The data are measurements of test scattering parameter calibration data for on-wafer measurements from 10 MHz to 110 GHz. Data includes S-parameter data (Ref_Cs_g25_HF_0.s2p, Ref_Rs_g25_HF_0.s2p,...

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• Organization: National Institute of Standards and Technology
• Updated: 2021-08-26 00:00:00

SRM 3461 is an AFM sized chip with an array of seven cantilevers on each chip. The uniformity of the chips offered for sale from wafer 2 is excellent and the SRM certificate reports values and...

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• Organization: National Institute of Standards and Technology
• Updated: 2024-01-23 00:00:00

data published in paper "On-Wafer Device Characterization Including Uncertainty Estimates to 1.0 THz"This dataset contains the calibrated scattering parameters (S-parameters) of a thru that was...

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• Organization: National Institute of Standards and Technology
• Updated: 2023-11-17 00:00:00

We present a method for accurately determining the permittivity of dielectric materials in 3D integrated structures at broadband RF frequencies. With applications of microwave and millimeter-wave...

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• Organization: National Institute of Standards and Technology
• Updated: 2022-11-22 00:00:00

data published in paper "A Tunable 220 GHz Comb Generator Realized with an Ultrawideband Mixer in a InP HBT Technology"

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• Organization: National Institute of Standards and Technology
• Updated: 2023-09-21 00:00:00

Included here are figures and other relevant data from the paper "Characterizing Interconnects to 325 GHz". Abstract: We developed an interconnect characterization procedure that first embeds the...

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• Organization: National Institute of Standards and Technology
• Updated: 2019-08-26 00:00:00

Four files are included in this data set for mask generation that can be used to produce photolithography contact masks to create NIST nanocalorimeters. Two different designs are included, each...

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• Organization: National Institute of Standards and Technology
• Updated: 2024-08-13 00:00:00

This dataset contains the simulated data of a ground-signal-ground on-wafer probe landed on a microstrip variable-impedance device (DUT) with a 775 micron (um) microstrip line neighboring the...

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