Test scattering parameter calibration data for on-wafer measurements from 10 MHz to 110 GHz - Calnet
The data are measurements of test scattering parameter calibration data for on-wafer measurements from 10 MHz to 110 GHz. Data includes S-parameter data (Ref_Cs_g25_HF_0.s2p, Ref_Rs_g25_HF_0.s2p, Ref_L1_g25_HF_0.s2p, Ref_S1_g25_HF_0.s2p, Ref_Rg_g25_HF_0.s2p, Ref_Og_g25_HF_0.s2p, Ref_L2_g25_HF_0.s2p, Ref_L3_g25_HF_0.s2p, Ref_L4_g25_HF_0.s2p, Ref_L5_g25_HF_0.s2p, Ref_L6_g25_HF_0.s2p, Ref_L7_g25_HF_0.s2p, Ref_L8_g25_HF_0.s2p, Ref_L9_g25_HF_0.s2p). Data is in an *.s2p format. The format is "# GHZ S RI R 50". Frequency is GHz, data is S-parameters as real and imaginary pairs to a reference impedance of 50 Ohms. The effective permittivity data is a frequency real part of permittivity and imaginary part of permittivity. The effective permittivity data is a frequency real part of characteristic impedance and imaginary part of characteristic impedance.
Complete Metadata
| @type | dcat:Dataset |
|---|---|
| accessLevel | public |
| accrualPeriodicity | irregular |
| bureauCode |
[
"006:55"
]
|
| contactPoint |
{
"fn": "Nate Orloff",
"hasEmail": "mailto:nathan.orloff@nist.gov"
}
|
| description | The data are measurements of test scattering parameter calibration data for on-wafer measurements from 10 MHz to 110 GHz. Data includes S-parameter data (Ref_Cs_g25_HF_0.s2p, Ref_Rs_g25_HF_0.s2p, Ref_L1_g25_HF_0.s2p, Ref_S1_g25_HF_0.s2p, Ref_Rg_g25_HF_0.s2p, Ref_Og_g25_HF_0.s2p, Ref_L2_g25_HF_0.s2p, Ref_L3_g25_HF_0.s2p, Ref_L4_g25_HF_0.s2p, Ref_L5_g25_HF_0.s2p, Ref_L6_g25_HF_0.s2p, Ref_L7_g25_HF_0.s2p, Ref_L8_g25_HF_0.s2p, Ref_L9_g25_HF_0.s2p). Data is in an *.s2p format. The format is "# GHZ S RI R 50". Frequency is GHz, data is S-parameters as real and imaginary pairs to a reference impedance of 50 Ohms. The effective permittivity data is a frequency real part of permittivity and imaginary part of permittivity. The effective permittivity data is a frequency real part of characteristic impedance and imaginary part of characteristic impedance. |
| distribution |
[
{
"title": "Test S-parameter data for on-wafer calibrations from 10 MHz to 110 GHz",
"mediaType": "application/x-zip-compressed",
"description": "Data includes S-parameter data (Ref_Cs_g25_HF_0.s2p, Ref_Rs_g25_HF_0.s2p, Ref_L1_g25_HF_0.s2p, Ref_S1_g25_HF_0.s2p, Ref_Rg_g25_HF_0.s2p, Ref_Og_g25_HF_0.s2p, Ref_L2_g25_HF_0.s2p, Ref_L3_g25_HF_0.s2p, Ref_L4_g25_HF_0.s2p, Ref_L5_g25_HF_0.s2p, Ref_L6_g25_HF_0.s2p, Ref_L7_g25_HF_0.s2p, Ref_L8_g25_HF_0.s2p, Ref_L9_g25_HF_0.s2p). Data is in an *.s2p format. The format is "# GHZ S RI R 50". Frequency is GHz, data is S-parameters as real and imaginary pairs to a reference impedance of 50 Ohms. The effective permittivity data is a frequency real part of permittivity and imaginary part of permittivity. The effective permittivity data is a frequency real part of characteristic impedance and imaginary part of characteristic impedance.",
"downloadURL": "https://data.nist.gov/od/ds/mds2-3404/V2.zip"
},
{
"mediaType": "text/plain",
"downloadURL": "https://data.nist.gov/od/ds/mds2-3404/3404_README.txt"
}
]
|
| identifier | ark:/88434/mds2-3404 |
| issued | 2024-08-26 |
| keyword |
[
"110 GHz",
"Calnet",
"S-parameter",
"SOLT",
"check standards",
"impedance",
"multiline TRL",
"on-wafer",
"probes",
"propagation constant",
"sapphire",
"series resistor",
"vector network analyzer"
]
|
| landingPage | https://data.nist.gov/od/id/mds2-3404 |
| language |
[
"en"
]
|
| license | https://www.nist.gov/open/license |
| modified | 2024-07-10 00:00:00 |
| programCode |
[
"006:045"
]
|
| publisher |
{
"name": "National Institute of Standards and Technology",
"@type": "org:Organization"
}
|
| theme |
[
"Advanced Communications:Wireless (RF)",
"Electronics:Electromagnetics",
"Electronics:Semiconductors",
"Metrology:Electrical/electromagnetic metrology"
]
|
| title | Test scattering parameter calibration data for on-wafer measurements from 10 MHz to 110 GHz - Calnet |
