• Organization: National Institute of Standards and Technology
• Updated: 2022-10-22 00:00:00

This repository contains all of the data published in the figures of the paper "On-Wafer Vector-Network-Analyzer Measurements at mK Temperatures." Manuscript DOI:...

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• Organization: National Institute of Standards and Technology
• Updated: 2023-12-08 00:00:00

Here are included figures and other relevant data from the paper "On-Wafer Calibration Comparisons of Multiline TRL with Platinum and Gold Conductors" to be published in International Microwave...

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• Organization: National Institute of Standards and Technology
• Updated: 2024-01-23 00:00:00

data published in paper "On-Wafer Device Characterization Including Uncertainty Estimates to 1.0 THz"This dataset contains the calibrated scattering parameters (S-parameters) of a thru that was...

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• Organization: National Institute of Standards and Technology
• Updated: 2023-06-29 00:00:00

Fused silica has become an interesting alternative to silicon for millimeter-wave (mmWave) applications. Unfortunately, there are few reports on the measurement of fused silica’s permittivity...

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• Organization: National Institute of Standards and Technology
• Updated: 2024-08-13 00:00:00

This dataset contains the simulated data of a ground-signal-ground on-wafer probe landed on a microstrip variable-impedance device (DUT) with a 775 micron (um) microstrip line neighboring the...

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• Organization: National Institute of Standards and Technology
• Updated: 2024-07-10 00:00:00

The data are measurements of test scattering parameter calibration data for on-wafer measurements from 10 MHz to 110 GHz. Data includes S-parameter data (Ref_Cs_g25_HF_0.s2p, Ref_Rs_g25_HF_0.s2p,...

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• Organization: National Institute of Standards and Technology
• Updated: 2023-11-17 00:00:00

We present a method for accurately determining the permittivity of dielectric materials in 3D integrated structures at broadband RF frequencies. With applications of microwave and millimeter-wave...

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• Organization: National Institute of Standards and Technology
• Updated: 2023-06-08 00:00:00

Data published in paper "Microstrip and Grounded CPW Calibration Kit Comparison for On-Wafer Transistor Characterization from 220 GHz to 325 GHz"We investigated the effect of two uncertainty...

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• Organization: National Institute of Standards and Technology
• Updated: 2021-08-26 00:00:00

SRM 3461 is an AFM sized chip with an array of seven cantilevers on each chip. The uniformity of the chips offered for sale from wafer 2 is excellent and the SRM certificate reports values and...

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• Organization: National Institute of Standards and Technology
• Updated: 2023-05-22 00:00:00

DyScO3 (DSO) serves as a substrate on which to grow epitaxial thin films with extraordinary materials physics. The film properties are determined by the biaxial in-plane strain due to DyScO3's...

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• Organization: U.S. Department of Health & Human Services
• Updated: 2025-09-06

A method of measuring at least one electrical property of a semiconductor wafer includes providing an elastically deformable and electrically conductive contact having an insulative oxide layer...

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• Organization: National Aeronautics and Space Administration
• Updated: 2025-03-31

<p>SPECTROMETER:&nbsp; The grating spectrometer uses a curved grating fabricated on a high resistivity silicon wafer. Light will be coupled in via a silicon immersion lens and coupling waveguide....

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• Organization: U.S. Department of Health & Human Services
• Updated: 2025-09-06

A method of making an abrasive article for wafer planarization, the method comprising providing an abrasive coating composition, providing a backing having a first major surface, said surface...

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• Organization: National Institute of Standards and Technology
• Updated: 2014-05-22 00:00:00

This MEMS Calculator determines the following thin film properties from data taken with an optical interferometer or comparable instrument: a) residual strain from fixed-fixed beams, b) strain...

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• Organization: National Institute of Standards and Technology
• Updated: 2020-01-23 00:00:00

The data used to generate the graphs in figures 2, 4, 5 and 6 of the paper "Evaluating Uncertainty of Nonlinear Microwave Calibrations from Regression Residuals". The full reference is D. F....

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• Organization: National Institute of Standards and Technology
• Updated: 2024-06-10 00:00:00

Abstract from manuscript:We demonstrate a glass microwave microfluidic device for determining the permittivity of a wide range of liquid chemicals from 100 MHz to 10 GHz with relatively low...

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• Organization: National Institute of Standards and Technology
• Updated: 2022-11-22 00:00:00

data published in paper "A Tunable 220 GHz Comb Generator Realized with an Ultrawideband Mixer in a InP HBT Technology"

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• Organization: National Institute of Standards and Technology
• Updated: 2019-09-03 00:00:00

The data used to generate the graphs in figures 1-9 of the paper "Evaluating Uncertainty of Microwave Calibrations from Regression Residuals".The full citation is D. F. Williams, B. F. Jamroz, J....

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• Organization: National Institute of Standards and Technology
• Updated: 2022-12-15 00:00:00

Included here are figures and other relevant data from the paper "A distributed theory for contactless interconnects at terahertz frequencies". Abstract: Here we test a multimodal model for...

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• Organization: National Aeronautics and Space Administration
• Updated: 2025-03-31

This paper presents an experimental study of damage detection and quantification in riveted lap joints. Embedded lead zirconate titanate piezoelectric (PZT) ceramic wafer-type sensors are employed...

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