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NIST Electron Inelastic-Mean-Free-Path Database - SRD 71
The NIST Electron Inelastic-Mean-Free-Path Database provides values of electron inelastic mean free paths (IMFPs) principally for use in surface analysis by Auger-electron spectroscopy and X-ray photoelectron spectroscopy. The database includes IMFPs calculated from experimental optical data and IMFPs measured by elastic-peak electron spectroscopy. If no calculated or measured IMFPs are available for a material of interest, values can be estimated from the predictive IMFP formulae of Tanuma et al. and of Gries. IMFPs are available for electron energies between 50 eV and 10,000 eV although most of the available data are for energies less than 2,000 eV. A critical review of calculated and measured IMFPs has been published [C. J. Powell and A. Jablonski, J. Phys. Chem. Ref. Data 28, 19 (1999)].
Complete Metadata
| @type | dcat:Dataset |
|---|---|
| accessLevel | public |
| accrualPeriodicity | irregular |
| bureauCode |
[
"006:55"
]
|
| contactPoint |
{
"fn": "Justin Gorham",
"@type": "vcard:Contact",
"hasEmail": "mailto:justin.gorham@nist.gov"
}
|
| description | The NIST Electron Inelastic-Mean-Free-Path Database provides values of electron inelastic mean free paths (IMFPs) principally for use in surface analysis by Auger-electron spectroscopy and X-ray photoelectron spectroscopy. The database includes IMFPs calculated from experimental optical data and IMFPs measured by elastic-peak electron spectroscopy. If no calculated or measured IMFPs are available for a material of interest, values can be estimated from the predictive IMFP formulae of Tanuma et al. and of Gries. IMFPs are available for electron energies between 50 eV and 10,000 eV although most of the available data are for energies less than 2,000 eV. A critical review of calculated and measured IMFPs has been published [C. J. Powell and A. Jablonski, J. Phys. Chem. Ref. Data 28, 19 (1999)]. |
| distribution |
[
{
"title": "DOI Access to NIST Electron Inelastic-Mean-Free-Path Database - SRD 71",
"format": "text/html",
"accessURL": "https://dx.doi.org/10.18434/T48C78",
"mediaType": "text/html",
"description": "DOI Access to NIST Electron Inelastic-Mean-Free-Path Database - SRD 71"
},
{
"title": "Form to download the database",
"accessURL": "https://www-s.nist.gov/srd_online/index.cfm?fuseaction=home.main&productID=SRD71V1.2",
"description": "This database is free, but requires that a form be filled out in order to be able to download."
}
]
|
| identifier | ECBCC1C130082ED9E04306570681B10714 |
| keyword |
[
"Auger electron",
"Auger electron spectroscopy",
"ESCA",
"X ray photoelectron spectroscopy",
"XPS",
"electron spectroscopy for chemical analysis",
"inelastic mean free path",
"material database",
"photoelectron",
"photoelectron spectroscopy",
"photoemission",
"surface analysis"
]
|
| landingPage | https://www.nist.gov/srd/nist-standard-reference-database-71 |
| language |
[
"en"
]
|
| license | https://www.nist.gov/open/license |
| modified | 2010-12-01 00:00:00 |
| programCode |
[
"006:052"
]
|
| publisher |
{
"name": "National Institute of Standards and Technology",
"@type": "org:Organization"
}
|
| references |
[
"https://dx.doi.org/10.1063/1.556035",
"https://www.nist.gov/system/files/documents/srd/SRD71UsersGuideV1-2.pdf"
]
|
| theme |
[
"Standards:Reference data"
]
|
| title | NIST Electron Inelastic-Mean-Free-Path Database - SRD 71 |
